Join Microscopy Australia for the first FIB SIG user group meeting and discover the world of Focused Ion Beam systems (FIB)
Get inspired by FIB supported research in Australia and across the globe
Call for Abstracts
OPEN NOW
About
Call for abstracts open
The FIB SIG is looking forward to receiving abstracts on research supported by FIB technology including but not limited to APT and TEM lamella preparation, cross-sectioning, nanofabrication, 3D tomography, FIB technique development, Ga FIB, Xe PFIB, Helium Ion Microscopy, FIB for sample preparation, research supported by FIB technology, additive manufacturing, FIB-SIMS, correlative workflows involving FIB, cryo FIB.
Abstract submission closes 5 September 2021
Please send your abstracts to:
Hui Diao h.diao1@uq.edu.au
Annalena Wolff awolff@caltech.edu
Mitchell Nancarrow nancarro@uow.edu.au
Anders Barlow anders.barlow@unimelb.edu.au
Event details
Date
24-25 September 2021
Time
1:00 pm - 5:00 pm AEST (duration 8.0 hours)
Location
online event
Host organisation
Microscopy Australia